R&S R&S FPS40 FSP Spectrum Analyzer
Universal series of spectrum analyzers, the standard for mid-range spectrum analyzers
Ideal partner for R&D and production, with good level measurement uncertainty and excellent RF characteristics. R&S FSP adopts mature technology to provide excellent performance, reliability and service convenience.
Main feature:
·Frequency range 9 kHz ~ 3GHz, 7 GHz, 13 GHz, 30 GHz and 40 GHz
· Resolution bandwidth 1 Hz ~ 10 MHz
· Average display noise level--155 dBm (1 Hz)
· Phase noise --113 dB (1 Hz) at 10 kHz
· Other filters:
· 100 Hz ~ 5 MHz channel filter and RRC filter
· FFT filter 1Hz ~ 30 kHz
· EMI bandwidth and quasi-peak detector
· TOI, MC ACP(R), OBW, CCDF, APD and other measurement functions
· Cellular standard and universal standard measurement applications, such as phase noise, noise figure, etc.
Model
R&S FSP3 Spectrum Analyzer 9KHz to 3GHz
R&S FSP7 Spectrum Analyzer 9KHz to 7GHz
R&S FSP13 Spectrum Analyzer 9KHz to 13GHz
Frequency Range:
· FSP3: 9kHz (20Hz) ~ 3 GHz
· FSP7: 9kHz (20Hz) ~ 7 GHz
· FSP13: 9kHz (20Hz) ~ 13 GHz
· FSP30: 9kHz (20Hz) ~ 30 GHz
· FSP40: 9kHz (20Hz) ~ 40 GHz
RF performance:
· DANL typical value -155 dBm (1Hz) without preamplifier
· Typical phase noise -113 dBc/Hz @ 10 kHz deviation, carrier 500 MHz
· Typical phase noise-145 dBc/Hz @ 10 MHz deviation, carrier 500 MHz
· TOI typ. 10 dBm
· 1-dB-compression point 0 dBm
Accuracy:
The total level uncertainty below 3.6 GHz is 0.5dB
The linearity error is less than 0.2dB at -70 dB
IQ down converter:
· IF digital converter 12-bit 32MHz (20.4 MHz IF)
· IQ memory 2x128 ksamples
Speed:
· Frequency domain scan time 2.5ms
· Time domain scan time 1 μs
· Up to 70 remote measurements can be done through GPIB
· Up to 80 manual measurements (screen update)
R&S FSP30 Spectrum Analyzer 9KHz to 30GHz 1164.4391.30
R&S FSP40 Spectrum Analyzer 9KHz to 40GHz 1164.4391.40
Application field
·Research and development of wireless communication
·Production testing of wireless products
·Electromagnetic compatibility diagnosis and pre-compatibility test
·Outfield spectrum and demodulation test
·Product matching and system integration